Mobile QR Code QR CODE : Journal of the Korean Society of Civil Engineers
Title Thermal Performance Evaluation of Composite Phase Change Material Developed Through Sol-Gel Process
Authors 김성한(Jin, Xinghan) ; 헤이더 무하마드 지샨(Haider, Muhammad Zeeshan) ; 박민우(Park, Min-Woo) ; 허종완(Hu, Jong-Wan)
DOI https://doi.org/10.12652/Ksce.2023.43.5.0555
Page pp.555-566
ISSN 10156348
Keywords 테트라데칸; 상변화 물질; 축열; 활성탄; 졸겔; 테트라에틸오르토실리케이트 Tetradecane; Phase change material; Thermal storage; Activated carbon; SOL-GEL; TEOS
Abstract In this study, a composite phase change material (CPCM) produced using the SOL-GEL technique was developed as a thermal energy storage medium for low-temperature applications. Tetradecane and activated carbon (AC) were used as the core and supporting materials, respectively. The tetradecane phase change material (PCM) was impregnated into the porous structure of AC using the vacuum impregnation method, and a thin layer of silica gel was coated on the prepared composite using the SOL-GEL process, where tetraethylorthosilicate (TEOS) was used as the silica source. The thermal performance of the CPCM was analysed using differential scanning calorimetry (DSC) and thermogravimetric analysis (TGA). DSC results showed that the pure tetradecane PCM had melting and freezing temperatures of 6.4 ℃ and 1.3℃ and corresponding enthalpies 226 J/g and 223.8 J/g, respectively. The CPCM exhibited enthalpy of 32.98 J/g and 27.7 J/g during the melting and freezing processes at 7.1℃ and 2.4℃, respectively. TGA test results revealed that the AC is thermally stable up to 500℃, which is much higher than the decomposition temperature of the pure tetradecane, which is around 120℃. Moreover, in the case of AC-PCM and CPCM thermal degradation started at 80℃ and 100℃, respectively. The chemical stability of the CPCM was studied using Fourier-transform infrared (FT-IR) spectroscopy, and the results confirmed that the developed composite is chemically stable. Finally, the surface morphology of the AC and CPCM was analysed using scanning electron microscopy (SEM), which confirmed the presence of a thin layer of silica gel on the AC surface after the SOL-GEL process.